Nov 11, 2012– Yokohama, Japan (Techreleased) – DCG Systems, Inc. the leading provider of semiconductor diagnostic, characterization and defect localization solutions, today announced that a major power device manufacturer purchased DCG’s ELITE System for inspection of their next generation SiC power devices.
“Sensitivity of the system is much better than we had expected and beyond even some of the claimed specifications provided by DCG,” stated the Manager of the customer’s device development department. “The new laser marker was delivered on time and its performance has been much better than what had previously been available in the market.”
This system is one of the most sophisticated ELITE systems yet delivered to a customer comprising the newly developed laser marker, full IR lens options, double-sided probing and high voltage power analysis capability. “We believe this solution will help customers develop faster leading edge power devices. Employing new semiconductor materials such as SiC and GaN introduce increasing development and reliability challenges. The ELITE system is helping our customers strengthen their competitive edge in this growing market” commented Randy Schussler, VP and GM of the IRIS (InfaRed Imaging Systems) Business Unit at DCG Systems.
